ELEC 5600 [0.5 credit] (ELG 6360)
Digital Integrated Circuit Testing
Production testing of digital integrated circuits. Outline of methods of testing used in production. Testing schemes and design for testability. Faults and fault models, yield estimates, testability measures, fault simulation, test generation methods, sequential testing, scan design, boundary scan, built-in self test, CMOS testing.Summer session: some of the courses listed in this Calendar are offered during the summer. Hours and scheduling for summer session courses will differ significantly from those reported in the fall/winter Calendar. To determine the scheduling and hours for summer session classes, consult the class schedule at central.carleton.ca
Not all courses listed are offered in a given year. For an up-to-date statement of course offerings for the current session and to determine the term of offering, consult the class schedule at central.carleton.ca
